[E2E] A bunch of E2E tests fail on PVC for clearly unrelated change

[Fznamznon]

Describe the bug

These fail

  SYCL :: Adapters/level_zero/event-leak.cpp
  SYCL :: Adapters/level_zero/imm_cmdlist.cpp
  SYCL :: Adapters/level_zero/interop-thread.cpp
  SYCL :: Adapters/level_zero/interop.cpp
  SYCL :: Adapters/level_zero/interop_memcpy.cpp
  SYCL :: Adapters/level_zero/track_indirect_access_memory.cpp
  SYCL :: DeviceImageBackendContent/L0_interop_test.cpp
  SYCL :: Regression/barrier_waitlist_with_interop_event.cpp

in https://github.com/intel/llvm/actions/runs/19100035523/job/54601583238?pr=20560
of the PR #20560

To reproduce

Create a PR.

Environment

Additional context

No response